Call for Abstracts Deadline: February 10, 2014

The 2014 International Conference on Nanoscience + Technology (ICN+T) will provide an international forum for discussion of the latest developments in nanoscale science and technology and recent advances in scanning probe microscopy and related techniques. The ICN+T represents the convergence of the former International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM) and Nano, which were first combined in Basel, Switzerland in 2006. This conference will cover a range of topics in nanoscale science and technology, addressing the interdisciplinary, international nature of this exciting and rapidly growing field.



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